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Four Papers Accepted at IEEE IEDM 2025!

Congratulations! Four papers have been accepted at 2025 IEEE IEDM held at San Francisco!

Paper 1: Towards Scalable 3D Integration of 2T-nC FeRAM with Hundreds of Layer Stacking (Jiahui Duan* & Shan Deng*)

Paper 2: Securing 3D NAND Without Density Loss via In-Situ Encryption Using a Single Transistor XOR Cell (Jiahui Duan)

Paper 3: Atomic Layer Deposited Amorphous Ge-Doped Indium Oxide with Enhanced Mobility–Stability–
Crystallization Resistance Tradeoff (YuShan Lee* & Xingtian Wang* & Jiahui Duan*)

Ppaer 4: Comprehensive Evaluation of Challenges in Realizing Disturb-Free Ferroelectric Vertical NAND
via String-Compatible Independent Pass Gates (Xuezhong Niu)

*: Co-first author at NEEDs group